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E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104 October 2016.
ID 48
分類 国際会議録(査読有)
タグ combinatorial distance-integrated testing
表題 (title) Distance-Integrated Combinatorial Testing
表題 (英文)
著者名 (author) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,Akihisa Yamada
英文著者名 (author) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,
編者名 (editor)
編者名 (英文)
キー (key) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,
書籍・会議録表題 (booktitle) Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 93-104
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 10
出版年 (year) 2016
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) This paper proposes a novel approach to combinatorial test generation, which achieves an increase of not only the number of new combinations but also the distance between test cases. We applied our distance-integrated approach to a state-of-the-art greedy algorithm for traditional combinatorial test generation by using two distance metrics, Hamming distance, and a modified chi-square distance. Experimental results using numerous benchmark models show that combinatorial test suites generated by our approach using both distance metrics can improve interaction coverage for higher interaction strengths with low computational overhead.

論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id48,
         title = {Distance-integrated Combinatorial Testing},
        author = {Eun-Hye Choi and Cyrille Artho and Takashi Kitamura and Osamu Mizuno and Akihisa Yamada},
     booktitle = {Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016)},
         pages = {93-104},
         month = {10},
          year = {2016},
}